Test and Application Center brought in the first ITC57300 dynamic parameter tester
2019/4/25 10:42:34|Number of visits:3470
On March 26, 2012, the Test and Application Center brought in the first ITC57300 dynamic parameter tester in China, which can test dynamic parameters for 2500V IGBT, MOSFET, diode and power transistor, further improving the test ability for test and application center. This device is designed and produced by American ITC company. It is a highly int...